Spectroscopic microscopy can quantify the statistics of subdiffractional refractive-index fluctuations in media with random rough surfaces
نویسندگان
چکیده
منابع مشابه
Spectroscopic microscopy can quantify the statistics of subdiffractional refractive-index fluctuations in media with random rough surfaces.
We previously established that spectroscopic microscopy can quantify subdiffraction-scale refractive index (RI) fluctuations in a label-free dielectric medium with a smooth surface. However, to study more realistic samples, such as biological cells, the effect of rough surface should be considered. In this Letter, we first report an analytical theory to synthesize microscopic images of a rough ...
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ژورنال
عنوان ژورنال: Optics Letters
سال: 2015
ISSN: 0146-9592,1539-4794
DOI: 10.1364/ol.40.004931